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The Engineering Toolbar
The Ultimate Resource for Engineering and Technical Research. (Learn More) |
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EMF meters detect and monitor harmful electric, magnetic or electromagnetic fields surrounding personal or work areas
Learn MoreWafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Non-destructive testing (NDT) conductivity meters and resistivity meters are devices for measuring electrical conductivity and/or resistivity of solid media to determine the characteristics of its constituent materials.
Search by Specification | Learn MoreMagnetic field sensors measure magnetic field strength, direction, and/or magnetic flux. They are used for scientific measurement, navigation, and industrial applications
Search by Specification | Learn MoreElectric test probes are used to establish a connection between a circuit under test and the measuring instrument
Search by Specification | Learn MoreCoordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure
Search by Specification | Learn MoreElectrical field strength sensors are used to measure the strength of electrical fields
Learn MoreTemperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes
Search by Specification | Learn MoreFiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes
Search by Specification | Learn MoreMagnetic field instruments include meters, gauges, recorders and other instrumentation for the measurement of magnetic fields and/or magnetic flux
Search by Specification | Learn MoreEddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications
Search by Specification | Learn MoreTemperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches. 
Search by Specification | Learn MoreThermocouple temperature probes are bimetallic style probes used for various temperature sensing applications
Search by Specification | Learn MoreElectrical and EMC testing services evaluate parts and products for electromagnetic compatibility (EMC), electromagnetic interference (EMI), radio frequency interference (RFI), dielectric properties, conductivity, electrostatic discharge (ESD), insulation resistance, and other electrical characteristics.
Search by Specification | Learn MoreThermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature
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Current Sensors Meet ATEX Requirements Ohio Semitronics, Inc.
Split Core Current Transformer - UL Approved Ohio Semitronics, Inc.
Flame Sensor - FS-2000E Series Takex America, Inc.
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Before sending an electronic product to a lab for compliance testing for EMI emissions, you can perform a precompliance (far-field) EMI measurement with a spectrum analyzer and an antennas. If the product's emissions above the amplitude levels set by national and international standards, you'll need to find the emissions sources to solve the problem. (read more)
Our FPMS-7 provides field strength levels that are being measured into a specific application. Monitoring is done by the FPMS and the measurement via our EFS-7 E-Field Sensors and probes just like with the LPA-5. The EFS-7 monitors the field level and transfers the field level to the FPMS via a fiber optic link. The FPMS comes with and without leveling for customers without software. (read more)
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
For users looking for an alternative to battery-operated touch probes for machining applications, HEIDENHAIN Corporation offers the TS 444 infrared touch probe. The new TS 444 can be powered by an alternative energy source in the form of compressed air supplied through the spindle of the machine tool, and can be of use with all HEIDENHAIN control systems. (read more)
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
The Gould-Bass Model MD-220 Magnetic Field Strength Meter is a portable handheld instrument with three and a half digit display that measures magnetic field strength. It combines the latest digital display and "Hall Effect" technology into a functional, rugged, and aesthetic design. The handheld meter provides the user with an easy means for accurately measuring magnetic fields. (read more)
Better Optical Efficiency Available for UV/VIS and NIR Measurements
Expand your existing analytical capabilities with Guided Wave's durable fiber optic probes and flow cells. Designed to last forever these products consistently deliver acurate spectral analysis. Enhanced performance is assured when integrated with any spectrometer, providing more consistent and reproducible data. (read more)
The Shuttle Probe is a unique and convenient process probe for monitoring liquid samples, in-situ. Rugged, reliable, and easy to use, it is ideal for continuous process monitoring applications where it is difficult and/or costly to shut down the line for probe servicing or where side streams or fast loops are not appropriate. (read more)
High-Speed Multi-Axis Machine Tool Probes from Renishaw. Renishaw OMP40 and OMP60 touch-trigger probes bring greater process control, higher machine utilization and Lean efficiencies to multi-axis/multi-tasking machine tools and high-speed, small-spindle-taper machines. Ultra-compact design maximizes application versatility, while unique programming simplifies installation. (read more)
In working with electrical power production and distribution, a key problem faced is being able to see the unseen - in other words, how does one view invisible electrical and magnetic forces at play? Tecplot helps utility researchers visualize magnetic fields. (read more)
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Electromagnetic Field Probe with Meter Output Electromagnetic Field Probe with Meter Output Notes: This tester is designed to locate stray electromagnetic (EM) fields. |
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SCI.SPACE FAQ No. 04 - space/math Deep-Space Solar-Probe and Out of Ecliptic Trajectories_, Technical Shoemaker, E.M. 1983 Asteroid and comet bombardment of the earth. |
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Electromagnetic Spectrum Each way of thinking about the EM spectrum is related to the others in a precise mathematical way. |
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Commerical Sites for Microscopy & Microanalysis Alpha Tec Ltd Light/Optical, Confocal, 2 Photon, Near Field, IR/Raman, Acoustic, Scanning Probe, Scanning Ion, X-Ray Microscopy, SEM, TEM, STEM, |
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Solve magnetic interference problems with magnetic shields. Calculator Usage Evaluator Probe Lab Kit Probe See Magnetic Shield Corporation Profile & Catalog |
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Electromagnetic Radiation: Field Memo PURPOSE: The purpose of this field service memo is to provide OSHA compliance officers with basic principles of electromagnetic (EM) radiation. See Occupational Safety & Health Administration (OSHA) Information |
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Moon - Wikipedia, the free encyclopedia 3.3 Gravity field 3.4 Magnetic field 3.5 Atmosphere The far side of the Moon was first photographed by the Soviet probe Luna 3 in 1959. |
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Solar wind - Wikipedia, the free encyclopedia |
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Pulsed Field Electrophoresis for Separation of Large DNA Pulsed Field Electrophoresis for Separation of Large DNA Published in Probe Volume 2(3): Fall 1992 |
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Wireless Network Security |