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Electromagnetic fields (EMF) are invisible lines of force produced by the voltage and current which surround electrical wires or devices. These physical fields consist of two components: the electric field, which is the result of the voltage; and the magnetic... Learn More
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More
RTD temperature probes convert the RTD resistance measurement to a current signal, eliminating the problems inherent in RTD signal transmission via lead resistance. Search by Specification | Learn More
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More
Eddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications. Search by Specification | Learn More
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More
Corrosion probes, corrosion coupons and corrosion coupon holders are corrosion-sensing devices that interface to instruments or monitors. Learn More
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters Search by Specification | Learn More
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Tenmars TM-194 RF Field Strength Meter Tenmars Electronics Co., Ltd.
Tenmars TM-192D .. Datalogging 3-Axis EMF Meter Tenmars Electronics Co., Ltd.
Hall Effect Gaussmeter Sypris Test & Measurement - F.W. Bell
Model 9185 Ionizer Tester TAKK Industries, Inc.
Model 9195 Neon Bar Checker TAKK Industries, Inc.
GFC-8131H Frequency Counter Fotronic Corporation / Test Equipment Depot
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Product News for E-Field Probe supplier
INSTRUMENTS FOR INDUSTRY E-Field Antennas
The EFG-3 E-Field generating antenna is designed to generate strong electric field intensities within its' vicinity for use in radiated susceptibility testing systems. The EFG-3 provides a means for dissipating any unused power through the use of a conventional coaxial 50 ohm termination of appropriate power handling capability. (read more)
Workpiece Touch Probes Increase Productivity
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
RMP600 machine probe out-of-sight in 3D precision
Bringing "out of sight" precision to complex 3D part measurement on machine tools, the new RMP600 touch probe combines two exclusive Renishaw technologies — highest accuracy strain-gage sensing and frequency-hopping spread-spectrum (FHSS) radio transmission. The design allows unmatched precision where obstacles or part features block transmission by optical line-of-sight probes. (read more)
RMP60 Frequency-Hopping Wireless Inspection Probe
The RMP60 inspection probe is the industry's first to use frequency hopping spread spectrum (FHSS) transmission to avoid plant floor interferences, enabling reliable, high-accuracy, fast-throughput part verification on machining centers of all sizes. (read more)
2-in-1 versatility - Scanning probes for your CMMs
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today. (read more)
Cable-free twin probe system for machine tools
Cable-free OTS Twin-Probe System from Renishaw performs automated part set-up, measurement, tool setting and broken tool detection. The machine tool system combines a spindle-mounted OMP40-2 inspection probe and OTS tool-setting probe with an optical receiver, enabling fast system integration and cable-free installation on machining centers, especially with twin pallets and rotary tables. (read more)
Heidenhain 3-D Touch Probes for 3rd Party Controls
Heidenhain has developed a new interface for its 3-D touch trigger probes (read more)
New Tool Setting Probe – OTS Tool Setting Probe
For broken tool detection and rapid tool length/diameter measurement use the new OTS, Renishaw's first tool setting probe with optical transmission. The robust, compact and cable-free design allows freedom of table movement, ideal for twin pallet or rotary table machines. (read more)
X Probe Socketless Series
The X Probe Socketless Series allows a more robust probe to be mounted on closer centers while maintaining a reliable electrical contact from the probe tip to the termination. The conventional method utilizes a probe and socket system. (read more)
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Design and Development of Medical Electronic Instrumentation
PREFACE The medical devices industry is booming. Growth in the industry has not stopped despite globally fluctuating economies. The main reason for this success is probably the self-sustaining...(read more)
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Fluke Networks ? technologies and solutions for... - IntelliTone? Pro Toner and Probe - Pro3000? Analog Tone and Probe - Probe Pic - Voltage Detector Toners and Probes See Fluke Networks Information |
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JEOL USA, Inc. - scanning electron microscopes,... See JEOL USA, Inc. Information |
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LVDS Owner's Manual - Low-Voltage Differential Signaling (PDF) National is the premier analog semiconductor solution supplier and the innovator of LVDS. Our experi- ence with LVDS gives us the insight to be your See National Semiconductor Information |
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Delphi Probe Air Meters E/E Architecture Entertainment & Communications E/E Architecture Entertainment & Communications See Delphi Corporation Information |
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Virtex-II Pro XCU2000-03 - Addition of PPT as a Substrate Supplier (PDF) See Xilinx, Inc. Information |
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WP110: Reed-Solomon Solutions with Spartan-II FPGAs About ISS ISS is a leading supplier of application-specific virtual components (ASVCs) for multimedia and communications System-on-a-Chip (SOC) See Xilinx, Inc. Information |
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Ruggedized PC/104 including embedded data acquisition, analog... Great for debug and field service. Life gets easier. TRACER-E DIGITAL I/O Get maximum results in the the See Apex Embedded Systems Information |
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AZoM™ - The A to Z of Materials and AZojomo - The... See AZoM Information |
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Design Guidelines 34 Order and Receive Purchased Materials 35 Perform Assessments on New Supplier (Purchasing) 36 Develop Test Software 37 Issue Work Orders to |
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Intel? 5100 Memory Controller Hub Chipset for Communications,... July 2008 003 Added Figure 26, Figure 27, and Figure 28 Updated the supplier information February 2008 002 Updated the TDPMax config value to 25.7 W See Intel Corporation Information |
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