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Products/Services for H-Field Probe
Electromagnetic fields (EMF) are invisible lines of force produced by the voltage and current which surround electrical wires or devices. These physical fields consist of two components: the electric field, which is the result of the voltage; and the magnetic... Learn More
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More
RTD temperature probes convert the RTD resistance measurement to a current signal, eliminating the problems inherent in RTD signal transmission via lead resistance. Search by Specification | Learn More
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More
Eddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications. Search by Specification | Learn More
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More
Corrosion probes, corrosion coupons and corrosion coupon holders are corrosion-sensing devices that interface to instruments or monitors. Learn More
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters Search by Specification | Learn More
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Tenmars TM-194 RF Field Strength Meter Tenmars Electronics Co., Ltd.
Hall Effect Gaussmeter Sypris Test & Measurement - F.W. Bell
Tenmars TM-192D .. Datalogging 3-Axis EMF Meter Tenmars Electronics Co., Ltd.
Fluke 115 TRMS Digital Multimeter Fotronic Corporation / Test Equipment Depot
Fluke 289 TRMS Logging Digital Multimeter Fotronic Corporation / Test Equipment Depot
Volt Meters SenDEC Corporation Products Group
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Product News for H-Field Probe
Workpiece Touch Probes Increase Productivity
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
RMP600 machine probe out-of-sight in 3D precision
Bringing "out of sight" precision to complex 3D part measurement on machine tools, the new RMP600 touch probe combines two exclusive Renishaw technologies — highest accuracy strain-gage sensing and frequency-hopping spread-spectrum (FHSS) radio transmission. The design allows unmatched precision where obstacles or part features block transmission by optical line-of-sight probes. (read more)
RMP60 Frequency-Hopping Wireless Inspection Probe
The RMP60 inspection probe is the industry's first to use frequency hopping spread spectrum (FHSS) transmission to avoid plant floor interferences, enabling reliable, high-accuracy, fast-throughput part verification on machining centers of all sizes. (read more)
2-in-1 versatility - Scanning probes for your CMMs
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today. (read more)
Cable-free twin probe system for machine tools
Cable-free OTS Twin-Probe System from Renishaw performs automated part set-up, measurement, tool setting and broken tool detection. The machine tool system combines a spindle-mounted OMP40-2 inspection probe and OTS tool-setting probe with an optical receiver, enabling fast system integration and cable-free installation on machining centers, especially with twin pallets and rotary tables. (read more)
Heidenhain 3-D Touch Probes for 3rd Party Controls
Heidenhain has developed a new interface for its 3-D touch trigger probes (read more)
New Tool Setting Probe – OTS Tool Setting Probe
For broken tool detection and rapid tool length/diameter measurement use the new OTS, Renishaw's first tool setting probe with optical transmission. The robust, compact and cable-free design allows freedom of table movement, ideal for twin pallet or rotary table machines. (read more)
X Probe Socketless Series
The X Probe Socketless Series allows a more robust probe to be mounted on closer centers while maintaining a reliable electrical contact from the probe tip to the termination. The conventional method utilizes a probe and socket system. (read more)
The Standard in Probing Microscopy
The New A-Zoom Micro offers an economical solution for semiconductor probing or circuit board and flat-panel display inspection without sacrificing features, function or performance. (read more)
Parts by Number for H-Field Probe
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| CTK015 | Newark | 3M | Misc | Test, Electromagnetic Field; Kit Contents:One E and H field probe, plastic storage case, batteries, 6? cable (models CTK015 and CTK019 only) and a user's guide; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No RoHS Compliant: No |
| CTK019 | Newark | 3M | Misc | Test, Electromagnetic Field; Kit Contents:One E and H field probe, plastic storage case, batteries, 6? cable (models CTK015 and CTK019 only) and a user's guide; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No RoHS Compliant: No |
Conduct Research
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Design and Development of Medical Electronic Instrumentation
PREFACE The medical devices industry is booming. Growth in the industry has not stopped despite globally fluctuating economies. The main reason for this success is probably the self-sustaining...(read more)
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NASA's Explorer Missions 60-014A-02 Explorer 8,Ion Traps Bourdeau 60-014A-03 Explorer 8,Langmuir Probe Berg 60-014A-04 Explorer 8,Micrometeorites Berg 60-014A-05 Explorer |
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Solar Flares and Magnetic Shear fields traced by the chromospheric structures in the H-alpha image overlay the photospheric field measured by the vector magnetograph. |
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Physical Review Special Topics - Accelerators and Beams Robert H. Siemann?encounters and essays We deeply regret the passing of our friend and colleague, Robert H. Siemann, on September 16, 2008. |
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7405 E & H Near Field Probe Set| ETS-Lindgren 7405 E & H Near Field Probe Set ETS-Lindgren's Model 7405 E & H Near Field Probe Set is a passive, near field probe set designed as See ETS-Lindgren Information |
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Electromagnetic Radiation: Field Memo Electromagnetic Radiation: Field Memo ? FIELD SERVICE MEMO ? ELECTROMAGNETIC RADIATION and HOW IT AFFECTS YOUR INSTRUMENTS See Occupational Safety & Health Administration (OSHA) Information |
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HOM damping with coaxial dampers in a pillbox cavity without... pillbox cavity H-loop couplers E-probe couplers minimum coupling cylindrical prototype cavity fundamental frequency equatorial plane H-loop dampers |
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Tektronix: Products > Video Test > MPEG and Next... Transitioning to H.264 Glossary of Video Terms and Acronyms Probe Selector Oscilloscope Probes & Accessories See Tektronix, Inc. Information |
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Cosmic ray - Wikipedia, the free encyclopedia energy nuclei presumably due to their escape from the galactic magnetic field. |
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Interstellar medium - Wikipedia, the free encyclopedia The distribution of ionized hydrogen (known by astronomers as H II from old spectroscopic terminology) in the parts of the Galactic interstellar |
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Near-Field Optics - SPIE's 1995 International Symposium on... Dependence of contrast on probe/sample spacing with the magneto-optic Kerr effect scanning near-field magneto-optic microscope (MOKE-SNOM) |
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