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Products/Services for probe position
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products. Search by Specification | Learn More
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More
Linear position sensors is a general search form for all linear position / displacement detection product areas. Search by Specification | Learn More
Nondestructive testing (NDT) probes and sensors include eddy current, ultrasonic, induction, hall effect and EMAT and other specialized transducers. Search by Specification | Learn More
Eddy current probes induce detectable eddy currents in ferrous and nonferrous material for flaw detection, weld inspection, and other nondestructive test applications. Search by Specification | Learn More
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More
Fiber optic linear position sensors use fiber optic technology to sense position and displacement. Search by Specification | Learn More
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes. Search by Specification | Learn More
Thermistor temperature probes sense temperature by using thermistors, devices made of semiconductor materials which exhibit a large change in resistance for a small change in temperature. Search by Specification | Learn More
Thermocouple temperature probes are bimetallic probes that are used in various temperature-sensing applications. They consist of two wires, each of which is made of a different metallic element or alloy. Search by Specification | Learn More
Linear slides are simple linear motion devices composed of a stationary base and a moving carriage. Linear stages are slides with a drive mechanism that provide controlled, precise positioning along a linear axis. Search by Specification | Learn More
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More
Valve positioners compare a control signal to a valve actuator’s position and move the actuator accordingly. They are used with both linear valves and rotary valves. Search by Specification | Learn More
Rotary position sensors include potentiometers, resolvers and a variety of magnetic and capacitive technologies. Sensors are designed for angular displacement less than one turn or for multiturn displacement. Search by Specification | Learn More
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn More
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New Touch Probe Suitable for Mechanical Activation Heidenhain Corporation
GPD Series Measuring Probes Capacitec, Inc.
RPS-150 Self Contained Sensor Migatron Corporation
DZ 135 High speed revolution counter Micro-Epsilon
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe Heidenhain Corporation
Button Sensor Probe Series Capacitec, Inc.
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Product News for probe position
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today. (read more)
Workpiece Touch Probes Increase Productivity
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation (read more)
Ball Runner With Stylus Probe
The NDT Technologies PRO Series Profilers provide the user with the capability to not only extract a real time profile from a part that represents its dimensions, but also make multiple measurements of two or more part dimensions, simultaneously. (read more)
RMP60 Frequency-Hopping Wireless Inspection Probe
The RMP60 inspection probe is the industry's first to use frequency hopping spread spectrum (FHSS) transmission to avoid plant floor interferences, enabling reliable, high-accuracy, fast-throughput part verification on machining centers of all sizes. (read more)
2-in-1 versatility - Scanning probes for your CMMs
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability (read more)
Heidenhain 3-D Touch Probes for 3rd Party Controls
Heidenhain has developed a new interface for its 3-D touch trigger probes (read more)
New Tool Setting Probe – OTS Tool Setting Probe
For broken tool detection and rapid tool length/diameter measurement use the new OTS, Renishaw's first tool setting probe with optical transmission. The robust, compact and cable-free design allows freedom of table movement, ideal for twin pallet or rotary table machines. (read more)
Positioner with encoders
Modularly designed UniSlide Assemblies are easily assembled for multi-coordinate movement. Optional glass scale linear encoders can be used to increase resolution to 2 micron (0.0001"). (read more)
New Touch Probe Suitable for Mechanical Activation
The new infrared TS 642 touch probe from HEIDENHAIN features mechanical probe activation and is suitable for both older HEIDENHAIN controls as well as current third party controls. This is especially useful in machines that are not set up to offer touch probes as standard options. A key component is a mechanical activation microswitch in the taper shank. This makes it useful for ... (read more)
Button Sensor Probe Series
A tremendous advantage in measuring displacement and part dimensional changes can be gained by use of thin "side-looking" Capacitec® button probes. Their forte is in thin gap inspection and tolerances measured inboard and hidden in difficult to investigate products. They are often used in pairs to compensate for part misalignment and gage positioning. (read more)
Parts by Number for probe position
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| TT-SI 9101 | Newark | TESTEC | All Supplier Direct Ship | PROBE, DIFFERENTIAL, ACTIVE, 100MHZ; Attenuation:1:10 / 1:100; Voltage rating, AC:700V; Bandwidth, x1 position:100MHz; Capacitance, input x1 position:7pF; Resistance, input x 1 position:4 MR RoHS Compliant: NA |
| EK47026 | PLC Radwell | ALLEN BRADLEY | Not Provided | 2100 PROBE DRIVER ENCLOSURE, 4-POSITION, NEMA 4 |
| GTN1A115 | Powell Electronics, Inc. | HONEYWELL | Not Provided | Sensors, Magnetic Position Sensors, Gear-Tooth Position Sensors |
| GTN1A211 | Powell Electronics, Inc. | HONEYWELL | Not Provided | Sensors, Magnetic Position Sensors, Gear-Tooth Position Sensors |
| GTN1A112 | Powell Electronics, Inc. | HONEYWELL | Not Provided | Sensors, Magnetic Position Sensors, Gear-Tooth Position Sensors |
Conduct Research
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No contact means no headaches in position transducing
Novotechnik's noncontacting position sensor operates on the principle of capacitively coupling an ac voltage from a resistive track to a moving probe. The probe picks up a voltage signal that is...(read more)
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Brushed-dc and Piezo Motors Combine for Precise Position
Brushed-dc and Piezo Motors Gang Up for Precise Position A symbiosis of fast dc drives and precision piezo motors gives rise to high-accuracy positioners. Whether in electronics, mechanical...(read more)
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Artifact Probing Unlocks Higher Machining Accuracies
A probing technique called artifact or reference comparison lets machining centers test their positioning accuracy against dimensional masters to determine corrective compensations. It is especially...(read more)
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Scanning Probe Microscopes and Atomic Force Microscopes
Scanning probe and atomic force (SPM / AFM) microscopes are used to study surface features by moving a sharp probe over the object's surface (e.g., the scanning tunneling microscope). Atomic force...(read more)
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Milling good parts from bad geometry
Accurate and efficient machining usually depends on three things: Position of the workpiece, shape of the stock at the start of the operation, and the shape to be produced. Machine tools can pick up a...(read more)
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Magnetostrictive Position Transducers in Medical Applications
Magnetostrictive position transducers are non-contact, absolute reading, and have essentially infinite resolution. The non-contact nature of this technology means that there are no rubbing or sliding...(read more)
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Ultrasound scans IN THIN AIR
Better transducers and inexpensive, high-accuracy gantries expand the scope of noncontact ultrasound imaging. The marriage of Airtech 4000 ultrasonic imagers and Techno-Isel gantries lets users...(read more)
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Fast Response Optical Sensors Prove Invaluable in Demanding Gaging Applications
Fiber optic sensors operate by monitoring the amount of light reflected from the target surface being measured. They are able to precisely determine parameters such as displacement, vibration,...(read more)
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Wedge drives precision elevator
A positioning table converts horizontal motion into precise vertical movements. The PZA 25 vertical positioning stage comes with an optional Class 10 clean-room approval. The traditional approach of...(read more)
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AFRL Advances Autonomous Aerial Refueling
The U.S. Air Force Research Laboratory (AFRL) is kicking off the second phase of its automated aerial refueling (AAR) program to demonstrate the capability to refuel unmanned aircraft in flight. AFRL...(read more)
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Galileo Project Information Probe Release Date: 13 July 1995 at 05:30 UTC Entry Date: 07 December 1995 |
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Pioneer Venus Project Information an electron temperature probe to study the thermal properties of the ionosphere |
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Renishaw: touch probes, rotary encoders, linear encoders,... Probe upgrades and offers Position encoders CMM probe systems Renscan5 five-axis scanning See Renishaw Profile & Catalog |
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GENERAL TOOLS 707865 Probe and Position Set With Case, 12 Pc See Grainger Industrial Supply Profile & Catalog |
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Global Test Supply GTS2850 Switchable 3-Position 1x/10x/REF... Global Test Supply GTS2850 Switchable 3-Position 1x/10x/REF Probe Global Test Supply GTS2850 Switchable 3-Position 1x/10x/REF Probe See Global Test Supply Information |
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METHOD 2G--DETERMINATION OF STACK GAS VELOCITY AND VOLUMETRIC... Offset (R ). The rotational position of a probe's SLO reference scribe line relative to the probe's yaw-null position, as determined during the yaw |
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Non-contact position sensor housing using existing torque... Non-contact position sensor housing using existing torque sensor probe -> Monitor Keywords |
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Cantilever with control of vertical and lateral position of... Cantilever with control of vertical and lateral position of contact probe tip -> Monitor Keywords |
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[No Title] Scanning probe lithography with real time position control interferometer |
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Simulate motion sensor in mechanical translational systems -... translational nodes into a control signal proportional to velocity or position. You can specify the initial position (offset) as a block parameter. See MathWorks, Inc. (The) Information |
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