Linear velocity sensors measure the linear velocity of an object using either contact or non-contact techniques

Opacity sensors and instruments measure the amount of light transmitted through a sample

Web sensing and scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture

Capacitive linear position sensors are devices that sense position / displacement using capacitance technology

Tactile pressure sensors are used to detect the pressure distribution between a sensor and a target

Moisture meters are used to measure the moisture content in bulk solids, liquids and gases.

Specialty nondestructive testing (NDT) probes and sensors are specialized or proprietary devices for NDT

Weather instruments are designed to measure one or multiple components of weather including wind speed and direction, rain or snow fall, solar radiation, temperature, pressure and humidity.

Gas and air instruments detect, monitor or analyze gases present in an environment.

Electrical inductance sensors measure the inductance of an electrical component or system

Specialty or proprietary products related to environmental sensors and instruments

Solar radiation instruments measure the spectral range of radiation, including global solar radiation (sun + sky), net radiation (incoming solar - reflected solar) and the photosynthetic light spectrum.

Radiometers are used to measure the intensity of electromagnetic radiation (e.g., UVC, UVB, UVA, Vis, and IR).

Eddy current instruments are nondestructive testing (NDT) devices that induce detectable eddy currents in conductive materials. They are used to detect flaws, determine thickness, inspect welds, measure conductivity, and sort alloys

Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.