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Non-Destructive Chamber Test System -- TME Solution-C

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The TME Solution-C™ test system produces quantitative test results from products that cannot be accessed to pressurize through an access port, as well as sealed, flexible medical, pharmaceutical and food packages. Surrogate chamber testing enables non-destructive, highly sensitive pressure or vacuum decay leak testing, returning good product to the assembly or packaging line.

The TME Solution-C system can detect holes as small as 5 microns. This highly sensitive method uses a proprietary chamber design to find leaks in product seals or walls and seals of common package materials such as films, foils and laminates widely used in industry today.

Specifications

Leak Test Method Pressure Differential / Decay; Vacuum decay
Output Options Switch or Alarm Signal
Local Interface Digital Front Panel; Computer Interface
Computer Interface Options Serial Interface


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